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Equipment of Technische Universität Dresden (TUD)

Technische Universität Dresden (TUD)
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UPLC System

Manufacturer: Thermo Fisher Scientific GmbH
Model: Dionex3000 Ultimate Nanoflow
Facility: Molecular Analysis / Mass Spectrometry

Nanoflow UPLC System for Quantitative Proteomics and protein/peptide analysis commonly equipped with 75µm i.d. C18 reversed phase columns (with trap column).

 

Test Bench for Electrical Machines and Drives

Manufacturer: Fa. Berghof Mühlhausen/Thüringen
Model: Sonderanfertigung
Facility: Chair of Electrical Machines and Drives

 

Transmission Electron Microscope (TEM)

Manufacturer: JEOL GmbH
Model: 1400plus (120kV)
Facility: Chair of Physical Chemistry

The 1400Plus TEM features high resolution/high contrast imaging.

 

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: Carl Zeiss Microscopy GmbH
Model: Gemini DSM 982
Facility: Chair of Physical Chemistry

This scanning electron microscope (FESEM) enables high resolution imaging of surfaces of all kind of materials.

 

Multi-Beam Focused Ion Milling and Imaging System (SEM / FIB)

Manufacturer: JEOL GmbH
Model: JIB-4610F
Facility: Chair of Mechanics of Materials and Failure Analysis

This system incorporates an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun and a new FIB column capable of large milling currents (90 nA)

 

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: JEOL GmbH
Model: JSM-7800F
Facility: Chair of Mechanics of Materials and Failure Analysis

The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source.

 

Transmission Electron Microscope (TEM)

Manufacturer: JEOL GmbH
Model: JEM-2100
Facility: Chair of Mechanics of Materials and Failure Analysis

Analytisches Transmissionselektronenmikroskop der Firma JEOL vom Typ JEM-2100.

 

Scanning Electron Microscope (SEM)

Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Chair of Mechanics of Materials and Failure Analysis

Rasterelektronenmikroskop mit „Low-Vacuum“-Betrieb für die Untersuchung schlecht leitender Proben.

 

Erhitzungsmikroskop

Manufacturer: Fa. Hesse Instruments
Model: EM301
Facility: Laboratory for power plant chemistry

 

Leitz-Schmelzmikroskop

Manufacturer: Ernst Leitz Wetzlar GmbH (heute: Leica Microsystems)
Facility: Laboratory for power plant chemistry

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