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Equipment of Fraunhofer Institute for Material and Beam Technology (IWS)

Fraunhofer Institute for Material and Beam Technology (IWS)
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Resonant Testing Machine 50kn

Manufacturer: Russenberger Prüfmaschinenm AG
Model: RUMUL-GIGAFORTE
Facility: Competence Materials Characterization and Testing

Der elektromagnetisch angetriebene Resonanzpulsator ermöglicht eine Prüffrequenz von rund 1000 Hz und reduziert die Messzeiten zum Nachweis der Schwingfestigkeit von Werkstoffen erheblich.

 

Universal Testing System

Manufacturer: MTS Systems Corp.
Model: MTS-810
Facility: Competence Materials Characterization and Testing

"The 810 Material Testing System delivers a broad array of testing capabilities for both low and high force static and dynamic testing."

 

Multi-Beam Focused Ion Milling and Imaging System (SEM / FIB)

Manufacturer: JEOL GmbH
Model: JIB-4610F
Facility: Chair of Mechanics of Materials and Failure Analysis

This system incorporates an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun and a new FIB column capable of large milling currents (90 nA)

 

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: JEOL GmbH
Model: JSM-7800F
Facility: Chair of Mechanics of Materials and Failure Analysis

The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source.

 

Transmission Electron Microscope (TEM)

Manufacturer: JEOL GmbH
Model: JEM-2100
Facility: Chair of Mechanics of Materials and Failure Analysis

Analytisches Transmissionselektronenmikroskop der Firma JEOL vom Typ JEM-2100.

 

Scanning Electron Microscope (SEM)

Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Chair of Mechanics of Materials and Failure Analysis

Rasterelektronenmikroskop mit „Low-Vacuum“-Betrieb für die Untersuchung schlecht leitender Proben.

 

Tribometer / Rheometer

Manufacturer: Anton Paar
Model: Tribometer T-PTD 200 / Rheometer MRC 502
Facility: Chair of Large Area Laser Based Surface Structuring

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