Field Emission Scanning Electron Microscope (FE-SEM) JEOL GmbH JSM-7800F
|Name:||Field Emission Scanning Electron Microscope (FE-SEM)|
|Facility:||Chair of Mechanics of Materials and Failure Analysis|
|Partner:||Technische Universität Dresden (TUD)|
|Partner:||Fraunhofer Institute for Material and Beam Technology (IWS)|
The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source. The narrow energy spread of the emitting electrons result in optimal focusing capability for the electron beam and thus also enables excellent resolution.
0,8 nm (15 kV), 1,2 nm (1 kV)
EDX, WDX (Aztec, Fa.Oxford)
Link to Further Details
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Last updated at: 19 November 2018 at 11:47:17