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Field Emission Scanning Electron Microscope (FE-SEM) JEOL GmbH JSM-7800F

Basic Information

Name: Field Emission Scanning Electron Microscope (FE-SEM)
Manufacturer: JEOL GmbH
Model: JSM-7800F
Facility: Chair of Mechanics of Materials and Failure Analysis
Partner: Technische Universität Dresden (TUD)
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source.

Description

The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source. The narrow energy spread of the emitting electrons result in optimal focusing capability for the electron beam and thus also enables excellent resolution.

 

Measure/Resolution:

0,8 nm (15 kV), 1,2 nm (1 kV)

Accessory/Options:

EDX, WDX (Aztec, Fa.Oxford)

Link to Further Details

https://www.jeol.de/electronoptics-en/products/scanning-electron-microscopes-sem.php

Options of instrument usage

Points of Contact

Mrs. Prof. Dr. M. Zimmermann / Mrs. Carina Dimter (Sec.)
Email:
Phone:
+49 351 463 33332
Fax:
+49 351 463 37129

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 19 November 2018 at 11:47:17