Dresden
Technology Portal

 
Your access to research infrastructure and know-how
de|en
View all instruments of this unit

Scanning Electron Microscope (SEM) JEOL GmbH JSM-6610LV

Basic Information

Name: Scanning Electron Microscope (SEM)
Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Chair of Mechanics of Materials and Failure Analysis
Partner: Technische Universität Dresden (TUD)
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Rasterelektronenmikroskop mit „Low-Vacuum“-Betrieb für die Untersuchung schlecht leitender Proben.

Description

Measure/Resolution:

3 nm (15 kV)

Accessory/Options:

EDX (Aztec, Fa.Oxford), Low Vakuum

Link to Further Details

http://www.jeol.de/electrohttps://www.jeol.co.jp/en/products/detail/JSM-6610series.html

Options of instrument usage

Points of Contact

Mrs. Prof. Dr. M. Zimmermann / Mrs. Carina Dimter (Sec.)
Email:
Phone:
+49 351 463 33332
Fax:
+49 351 463 37129

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 19 November 2018 at 11:30:13