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Transmission Electron Microscope (TEM) JEOL GmbH JEM-2100

Basic Information

Name: Transmission Electron Microscope (TEM)
Manufacturer: JEOL GmbH
Model: JEM-2100
Facility: Chair of Mechanics of Materials and Failure Analysis
Partner: Technische Universität Dresden (TUD)
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Analytisches Transmissionselektronenmikroskop der Firma JEOL vom Typ JEM-2100.

Description

Measure/Resolution:

0.14 nm

Accessory/Options:

EDX (JEOL)

Link to Further Details

https://www.jeol.de/electronoptics-en/products/transmission-electron-microscopes-tem.php

Options of instrument usage

Points of Contact

Mrs. Prof. Dr. M. Zimmermann / Mrs. Carina Dimter (Sec.)
Email:
Phone:
+49 351 463 33332
Fax:
+49 351 463 37129

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 19 November 2018 at 11:36:41