2D / 3D Confocal Measuring System confovis GmbH ConfoDisc CL200/CL300
|Name:||2D / 3D Confocal Measuring System|
|Partner:||Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden (IZM (ASSID))|
he confovis measuring system ConfoDisc CL200/CL300 based on the NIKON microskope L200 or L300 is particularly suitable for the detailed measurement of wafers in the semiconductor industry. As the smaller version, the wafer microscope systems supply razor-sharp details and precise measurements down to the nanometre range.
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This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Last updated at: 13 July 2017 at 11:54:13