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Wafer Testing And Metrology - Wafer Surface Profiler Veeco Instruments Inc. Dektak V 300-Si

Basic Information

Name: Wafer Testing And Metrology - Wafer Surface Profiler
Manufacturer: Veeco Instruments Inc.
Model: Dektak V 300-Si
Partner: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden (IZM (ASSID))

Link to Further Details

http://www.veeco.com/

Points of Contact

M. J├╝rgen Wolf
Email:
Phone:
+49 351 795572-12
Fax:
+49 351 795572-19

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

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Last Update

Last updated at: 13 July 2017 at 11:54:13