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Focused Ion Beam (FIB) Microscope Carl Zeiss SMT CrossBeam NVision 40

Basic Information

Name: Focused Ion Beam (FIB) Microscope
Manufacturer: Carl Zeiss SMT
Model: CrossBeam NVision 40
Facility: Ion Beam Center (IBC)
Partner: Helmholtz-Zentrum Dresden-Rossendorf (HZDR)

Description

The NVision 40 CrossBeam is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and  analytical applications.

Link to Further Details

https://www.hzdr.de/db/Cms?pNid=3537

Options of instrument usage

Points of Contact

Dr. Stefan Facsko/ Mrs. Annette Weißig (Office)
Email:
Phone:
+49 351 260 - 2343
Fax:
+49 351 260 - 13378

Images

Last Update

Last updated at: 17 February 2019 at 19:59:20